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PCA9570GM4 - Remote 4-bit general purpose outputs for 1 MHz I2C-bus
PCA9570GM4是NXP恩智浦公司的一款I²C通用I/O产品,PCA9570GM4是Remote 4-bit general purpose outputs for 1 MHz I2C-bus,本站介绍了PCA9570GM4的封装应用图解、特点和优点、功能等,并给出了与PCA9570GM4相关的NXP元器件型号供参考。
PCA9570GM4 - Remote 4-bit general purpose outputs for 1 MHz I2C-bus - I²C通用I/O - I²C - 恩智浦
The PCA9570 is a CMOS device that provides 4 bits of General Purpose parallel Output(GPO) expansion in low voltage processor and handheld battery powered mobileapplications. It operates at 1?MHz I2C?bus speeds while maintaining backwardcompatibility to Fast-mode (400?kHz) and Standard-mode (100?kHz).
The PCA9570 is a streamlined GPO that consists of 4-bit push-pull outputs that offer lowcurrent consumption, small packaging options and a low operating voltage range of 1.1?Vto 3.6?V. The latched outputs are symmetrical 4?mA current drive capability at 3.3?V todrive various control logic. The PCA9570 output expander provides a simple solutionwhen additional outputs are needed while keeping interconnections and floor space to aminimum, for example, in battery powered mobile applications where PCBs are crowdedfor interfacing to sensors, push buttons, etc.
The PCA9570 contains an internal Power-On Reset (POR) and a Software Reset featurethat initializes the device to its default state.
- 1 MHz I2C-bus interface with 6?mA SDA sink capability for lightly loaded buses(<100?pF) and improved power consumption
- Compliant with the I2C-bus Fast and Standard modes
- 1.1 V to 3.6 V operation
- Latched outputs with a sink/source capability of 4?mA at 3.3?V
- Readable device ID (manufacturer, device type, and revision)
- Software Reset
- Power-On Reset
- Low standby current
- -40?°C to +85?°C operation
- ESD protection exceeds 2000?V HBM per JESD22-A114 and 1000?V CDM perJESD22-C101
- Latch-up testing is done to JEDEC standard JESD78 which exceeds 100?mA
- Packages offered: TSSOP8, XQFN8 (0.4 mm lead pitch), XQFN8 (0.5?mm lead pitch)
- Smart phones and tablets
- Portable medical equipment
- Portable instrumentation and test measurement
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